Novel synthesis of kesterite Cu2ZnSnS4 thin films by linear sweep voltammetry: Study of structural, morphological and optical properties

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This work reports on the structural, morphological and optical properties of Cu2ZnSnS4 (CZTS) thin films grown by co-electrodeposition of different Cu, Sn and Zn elements using linear sweep voltammetry and cyclic voltammetry techniques. The obtained films were sulfurized in N2 atmosphere at 550°C for 1h. SEM analysis shows a very dense and uniform surface with large particles. X-ray diffraction patterns exhibit the kesterite structure of CZTS with the preferred orientation of the (112) plan. Raman spectroscopy measurements confirm the XRD results with clear peaks at 253, 289, 339 and 368 cm−1. In addition, the Raman shift was attributed to CZTS kesterite mode vibration. The band gap of CZTS film is found to be close to 1,48eV.

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