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Focused ion beam (FIB) in situ lift-out (INLO) technique showing

$ 16.00

4.7 (686) In stock

Ashley PAZ Y PUENTE, Assistant Professor, PhD Materials Science and Engineering (Northwestern), University of Cincinnati, Ohio, UC, Mechanical and Materials Engineering

FIB thinning ‒ CIME ‐ EPFL

Recent advances in focused ion beam technology and applications

Microstructural Characterization of U-Nb-Zr, U-Mo-Nb, and U-Mo-Ti Alloys via Electron Microscopy

Services and Rates - FIB/SEM Laboratory - University of Idaho

Focused ion beams: An overview of the technology and its

ARES, Research, Laboratories

The impact of focused ion beam induced damage on scanning

Ashley PAZ Y PUENTE, Assistant Professor, PhD Materials Science and Engineering (Northwestern), University of Cincinnati, Ohio, UC, Mechanical and Materials Engineering

Emmanuel PEREZ, Senior Engineer, Materials Science and Engineering, PhD, Savannah River National Laboratory, South Carolina, SRNL

How can integrated FLM simplify the cryo-FIB lift-out technique?

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